Machine learning plasma-surface interface for coupling sputtering and gas-phase transport simulations
This work addresses a computational bottleneck in thin film processing simulations, offering a more efficient alternative to interpolation or on-demand calculations, though it is incremental as it builds on existing simulation methods.
The paper tackles the challenge of coupling surface and gas-phase simulations in sputter deposition by proposing a machine learning interface to predict sputtered particle distributions, demonstrating that a trained neural network can accurately predict distributions for unknown incident ion energy distributions.
Thin film processing by means of sputter deposition inherently depends on the interaction of energetic particles with a target surface and the subsequent particle transport. The length and time scales of the underlying physical phenomena span orders of magnitudes. A theoretical description which bridges all time and length scales is not practically possible. Advantage can be taken particularly from the well-separated time scales of the fundamental surface and plasma processes. Initially, surface properties may be calculated from a surface model and stored for a number of representative cases. Subsequently, the surface data may be provided to gas-phase transport simulations via appropriate model interfaces (e.g., analytic expressions or look-up tables) and utilized to define insertion boundary conditions. During run-time evaluation, however, the maintained surface data may prove to be not sufficient. In this case, missing data may be obtained by interpolation (common), extrapolation (inaccurate), or be supplied on-demand by the surface model (computationally inefficient). In this work, a potential alternative is established based on machine learning techniques using artificial neural networks. As a proof of concept, a multilayer perceptron network is trained and verified with sputtered particle distributions obtained from transport of ions in matter based simulations for Ar projectiles bombarding a Ti-Al composite. It is demonstrated that the trained network is able to predict the sputtered particle distributions for unknown, arbitrarily shaped incident ion energy distributions. It is consequently argued that the trained network may be readily used as a machine learning based model interface (e.g., by quasi-continuously sampling the desired sputtered particle distributions from the network), which is sufficiently accurate also in scenarios which have not been previously trained.