A geometric characterisation of sensitivity analysis in monomial models
This work addresses sensitivity analysis for researchers in probabilistic modeling, offering incremental improvements in multi-parameter variations.
The paper tackles the problem of sensitivity analysis in discrete graphical models by introducing a geometric characterization for monomial models, demonstrating optimality of new proportional multi-way schemes with respect to I-divergence, and identifying conditions where proportional covariation is not optimal, including applications in Naive Bayes classifiers.
Sensitivity analysis in probabilistic discrete graphical models is usually conducted by varying one probability value at a time and observing how this affects output probabilities of interest. When one probability is varied then others are proportionally covaried to respect the sum-to-one condition of probability laws. The choice of proportional covariation is justified by a variety of optimality conditions, under which the original and the varied distributions are as close as possible under different measures of closeness. For variations of more than one parameter at a time proportional covariation is justified in some special cases only. In this work, for the large class of discrete statistical models entertaining a regular monomial parametrisation, we demonstrate the optimality of newly defined proportional multi-way schemes with respect to an optimality criterion based on the notion of I-divergence. We demonstrate that there are varying parameters choices for which proportional covariation is not optimal and identify the sub-family of model distributions where the distance between the original distribution and the one where probabilities are covaried proportionally is minimum. This is shown by adopting a new formal, geometric characterization of sensitivity analysis in monomial models, which include a wide array of probabilistic graphical models. We also demonstrate the optimality of proportional covariation for multi-way analyses in Naive Bayes classifiers.