An overlapping-free leaf segmentation method for plant point clouds
This addresses the problem of plant phenotyping for researchers and agricultural engineers by enabling precise leaf segmentation, though it is incremental as it builds on existing segmentation techniques.
The paper tackles the challenge of automatically segmenting individual leaves from 3D plant point clouds, which are often clustered and overlapped, by proposing a method using 3D filtering and facet region growing. It achieves high accuracy, with point-level cover rates up to 99% and leaf-level F-measure of 99.66% across multiple plant species.
Automatic leaf segmentation, as well as identification and classification methods that built upon it, are able to provide immediate monitoring for plant growth status to guarantee the output. Although 3D plant point clouds contain abundant phenotypic features, plant leaves are usually distributed in clusters and are sometimes seriously overlapped in the canopy. Therefore, it is still a big challenge to automatically segment each individual leaf from a highly crowded plant canopy in 3D for plant phenotyping purposes. In this work, we propose an overlapping-free individual leaf segmentation method for plant point clouds using the 3D filtering and facet region growing. In order to separate leaves with different overlapping situations, we develop a new 3D joint filtering operator, which integrates a Radius-based Outlier Filter (RBOF) and a Surface Boundary Filter (SBF) to help to separate occluded leaves. By introducing the facet over-segmentation and facet-based region growing, the noise in segmentation is suppressed and labeled leaf centers can expand to their whole leaves, respectively. Our method can work on point clouds generated from three types of 3D imaging platforms, and also suitable for different kinds of plant species. In experiments, it obtains a point-level cover rate of 97% for Epipremnum aureum, 99% for Monstera deliciosa, 99% for Calathea makoyana, and 87% for Hedera nepalensis sample plants. At the leaf level, our method reaches an average Recall at 100.00%, a Precision at 99.33%, and an average F-measure at 99.66%, respectively. The proposed method can also facilitate the automatic traits estimation of each single leaf (such as the leaf area, length, and width), which has potential to become a highly effective tool for plant research and agricultural engineering.