Convolutional Neural Networks for Automatic Detection of Artifacts from Independent Components Represented in Scalp Topographies of EEG Signals
This work addresses the need for fast, automated artifact detection in EEG-based brain-computer interfaces, replacing manual expert analysis.
The paper tackled the problem of automatically detecting artifacts in EEG signals by using convolutional neural networks to classify independent component topoplots, achieving over 98% accuracy and processing 32 topoplots in 1.4 seconds on a standard PC.
Electroencephalography (EEG) measures the electrical brain activity in real-time by using sensors placed on the scalp. Artifacts, due to eye movements and blink, muscular/cardiac activity and generic electrical disturbances, have to be recognized and eliminated to allow a correct interpretation of the useful brain signals (UBS) of EEG. Independent Component Analysis (ICA) is effective to split the signal into independent components (ICs) whose re-projections on 2D scalp topographies (images), also called topoplots, allow to recognize/separate artifacts and by UBS. Until now, IC topoplot analysis, a gold standard in EEG, has been carried on visually by human experts and, hence, not usable in automatic, fast-response EEG. We present a completely automatic and effective framework for EEG artifact recognition by IC topoplots, based on 2D Convolutional Neural Networks (CNNs), capable to divide topoplots in 4 classes: 3 types of artifacts and UBS. The framework setup is described and results are presented, discussed and compared with those obtained by other competitive strategies. Experiments, carried on public EEG datasets, have shown an overall accuracy of above 98%, employing 1.4 sec on a standard PC to classify 32 topoplots, that is to drive an EEG system of 32 sensors. Though not real-time, the proposed framework is efficient enough to be used in fast-response EEG-based Brain-Computer Interfaces (BCI) and faster than other automatic methods based on ICs.