Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner
This enables scalable and cost-effective material capture for applications in computer graphics and vision, though it builds incrementally on prior work.
The paper tackles the problem of estimating material reflectance and transmittance from any flatbed scanner by removing shading and specularity, achieving high-resolution and accurate results for full material appearance.
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy