Bi-Grid Reconstruction for Image Anomaly Detection
This addresses the challenge of detecting subtle defects in industrial inspection or quality control, representing an incremental advancement over existing un- and self-supervised methods.
The paper tackles the problem of fine-grained anomaly detection in images by introducing GRAD, a bi-grid reconstruction method that improves detection from both normal and abnormal perspectives, achieving significant performance improvements on datasets like MVTecAD, VisA, and GoodsAD.
In image anomaly detection, significant advancements have been made using un- and self-supervised methods with datasets containing only normal samples. However, these approaches often struggle with fine-grained anomalies. This paper introduces \textbf{GRAD}: Bi-\textbf{G}rid \textbf{R}econstruction for Image \textbf{A}nomaly \textbf{D}etection, which employs two continuous grids to enhance anomaly detection from both normal and abnormal perspectives. In this work: 1) Grids as feature repositories that improve generalization and mitigate the Identical Shortcut (IS) issue; 2) An abnormal feature grid that refines normal feature boundaries, boosting detection of fine-grained defects; 3) The Feature Block Paste (FBP) module, which synthesizes various anomalies at the feature level for quick abnormal grid deployment. GRAD's robust representation capabilities also allow it to handle multiple classes with a single model. Evaluations on datasets like MVTecAD, VisA, and GoodsAD show significant performance improvements in fine-grained anomaly detection. GRAD excels in overall accuracy and in discerning subtle differences, demonstrating its superiority over existing methods.