Dual-Branch Cross-Projection Debiasing through Diffusion-based Disentanglement
For practitioners training foundation models on biased data, this method improves worst-group accuracy without requiring group labels, addressing a key limitation in existing debiasing approaches.
The paper tackles bias in foundation models by proposing a dual-branch debiasing method that uses diffusion-based disentanglement to identify spurious attributes without group labels, achieving state-of-the-art worst-group accuracy while tuning only 0.22% of parameters.
Foundation models trained on biased datasets often rely on spurious correlations between target labels and non-causal attributes, resulting in poor generalization on minority groups. Bias mitigation remains challenging due to two fundamental issues. First, when group labels are unavailable, existing group-unsupervised methods typically infer spurious attributes implicitly from model behavior, making it difficult to identify spurious factors that are semantically aligned with real-world biases. Second, even with pseudo spurious supervision, most existing debiasing methods follow a single-branch design that operates within a single shared feature space, where target and spurious attributes are intrinsically entangled. To address the first challenge, we introduce Confidence-guided Bias Concept Mining (CBCM), which leverages diffusion-disentangled, semantically grounded concept representations to identify reliable spurious attributes without attribute annotations. To address the second challenge, we propose Dual-branch Cross-projection Debiasing (DCD), a prompt-tuning framework that separates target and spurious representations into two branches and explicitly removes spurious information through cross null-space projection while preserving target-relevant semantics. Extensive experiments on four benchmark datasets show that our method achieves state-of-the-art worst group accuracy among group-unsupervised approaches, while tuning at most 0.22% of the model parameters. The source code is available in the supplementary materials.