Zhiteng Chao

Yonghao Wang, Yang Yin, Hongqin Lyu et al.

LLMs can generate SystemVerilog assertions (SVAs) from natural language specs, but single-pass outputs often lack functional coverage due to limited IC design understanding. We propose CoverAssert, an iterative framework that clusters semantic and AST-based structural features of assertions, maps them to specifications, and uses functional coverage feedback to guide LLMs in prioritizing uncovered points. Experiments on four open-source designs show that integrating CoverAssert with AssertLLM and Spec2Assertion improves average improvements of 9.57 % in branch coverage, 9.64 % in statement coverage, and 15.69 % in toggle coverage.

Jiaping Tang, Jianan Mu, Tianyun Ma et al.

Debugging represents a time-consuming and labor-intensive task in hardware design, with bug localization constituting a substantial portion of this process. While spectrum-based bug localization techniques have achieved remarkable success in software domains and shown promise for hardware description languages, their effectiveness severely degrades in sequential designs. Unlike software programs, hardware designs exhibit intrinsic temporal characteristics that create fundamental challenges: timing misalignment between bug activation and observation, and progressive error propagation through state elements that obscures the root cause. To address these limitations, we propose Pecker, a novel bug localization framework that reconstructs the broken causal chain in sequential designs. Our approach introduces two key innovations: temporal backtracking using Estimated Minimal Propagation Cycles to identify potential activation cycles, strategic trace pruning to eliminate state pollution effects. We evaluate Pecker on comprehensive benchmarks comprising both combinational and sequential circuits. Experimental results demonstrate that Pecker effectively localizes 51%/80%/85% bugs within Top-1/3/5 ranks respectively, significantly outperforming state-of-the-art techniques. Notably, Pecker maintains robust performance across circuit complexities while existing methods exhibit severe degradation on sequential designs.

Xinyu Zhang, Zhiteng Chao, Yonghao Wang et al.

Register Transfer Level (RTL) design translates high-level specifications into hardware using HDLs such as Verilog. Although LLM-based RTL generation is promising, the scarcity of functionally verifiable high-quality data limits both accuracy and diversity. Existing post-training typically produces a single HDL implementation per specification, lacking awareness of RTL variations needed for different design goals. We propose RTLSeek, a post-training paradigm that applies rule-based Diversity-Oriented Reinforcement Learning to improve RTL correctness and diversity. Our Diversity-Centric Multi-Objective Reward Scheduling integrates expert knowledge with EDA feedback, and a three-stage framework maximizes the utility of limited data. Experiments on the RTLLM benchmark show that RTLSeek surpasses prior methods, with ablation results confirming that encouraging broader design-space exploration improves RTL quality and achieves the principle of "the more generated, the better results." Implementation framework, including the dataset, source code, and model weights, is shown at https://anonymous.4open.science/r/DAC2026ID71-ACB4/.

Yonghao Wang, Hongqin Lyu, Boling Chen et al.

Functional verification has become the most time-consuming phase in IC development, and Assertion-Based Verification (ABV) is key to reducing debugging time. However, existing LLM-based assertion generation methods typically pursue indiscriminate verification, aiming for maximal coverage without considering signal criticality, whereas industrial practice demands maximizing coverage with minimal verification cost. Consequently, identifying signals that have the greatest impact on design functionality and error propagation-enabling a shift from indiscriminate to targeted verification-remains a key challenge. To address this, we propose AgileAssert, a key signal-driven assertion generation framework that constructs RTL semantic graphs and identifies the top-K critical signals via a hybrid scoring and selection mechanism, followed by structure-aware RTL slicing to provide the LLM with precise targets and contextual information, thereby guiding LLMs to generate tightly constrained targeted assertions for efficient verification. Evaluated on block- and CPU-level designs, with an average 66.68% reduction in assertions, our approach outperforms three existing SOTA methods, and significantly improving coverage metrics while reducing input token consumption by 64%. In mutation testing, when our approach surpasses existing methods in error detection rate, the average number of assertions used decreases by 72.74%.

Hongqin Lyu, Yonghao Wang, Zhiteng Chao et al.

Assertion-based Verification (ABV) is essential for ensuring that hardware designs conform to their intended specifications. However, existing automated assertion-generation approaches, such as LLM-based frameworks, often generate large numbers of redundant assertions, which significantly degrade simulation efficiency. To mitigate the simulation overhead caused by redundant assertions, this paper proposes Arcane, an efficient assertion reduction framework. It integrates a two-tier assertion clustering approach for accurate semantic classification of large assertion sets, and employs Monte Carlo Tree Search (MCTS) to explore optimal rule-application sequences for efficient assertion reduction. The experimental results on Assertionbench [20] show that Arcane achieves a reduction of up to 76.2% in the assertion count while fully preserving formal coverage and mutation-detection ability. Further simulation studies demonstrate a speedup of 2.6x to 6.1x speedup in simulation time. The proposed framework is released at https://anonymous.4open.science/r/Arcane1-0A6F/.

Bin Sun, Jingyi Zhou, Jianan Mu et al.

In traditional EDA flows, layout-level performance metrics are only obtainable after placement and routing, hindering global optimization at earlier stages. Although some neural-network-based solutions predict layout-level performance directly from netlists, they often face generalization challenges due to the black-box heuristics of commercial placement-and-routing tools, which create disparate data across designs. To this end, we propose ParaGate, a three-step cross-stage prediction framework that infers layout-level timing and power from netlists. First, we propose a two-phase transfer-learning approach to predict parasitic parameters, pre-training on mid-scale circuits and fine-tuning on larger ones to capture extreme conditions. Next, we rely on EDA tools for timing analysis, offloading the long-path numerical reasoning. Finally, ParaGate performs global calibration using subgraph features. Experiments show that ParaGate achieves strong generalization with minimal fine-tuning data: on openE906, its arrival-time R2 from 0.119 to 0.897. These results demonstrate that ParaGate could provide guidance for global optimization in the synthesis and placement stages.

Bin Sun, Rengang Zhang, Zhiteng Chao et al.

Automatic test pattern generation (ATPG) is a crucial process in integrated circuit (IC) design and testing, responsible for efficiently generating test patterns. As semiconductor technology progresses, traditional ATPG struggles with long execution times to achieve the expected fault coverage, which impacts the time-to-market of chips. Recent machine learning techniques, like reinforcement learning (RL) and graph neural networks (GNNs), show promise but face issues such as reward delay in RL models and inadequate circuit representation in GNN-based methods. In this paper, we propose InF-ATPG, an intelligent FFR-driven ATPG framework that overcomes these challenges by using advanced circuit representation to guide RL. By partitioning circuits into fanout-free regions (FFRs) and incorporating ATPG-specific features into a novel QGNN architecture, InF-ATPG enhances test pattern generation efficiency. Experimental results show InF-ATPG reduces backtracks by 55.06\% on average compared to traditional methods and 38.31\% compared to the machine learning approach, while also improving fault coverage.